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This program uses the modeling functions of the IMFP from two publications:
Elastic Scateering corrections in AES and XPS. II Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments P.J.Cumpson and M.P. Seah Quantitative Electron Spectroscopy of Surfaces: A standard Data Base for Electron Inelastic Mean Free Paths in Solids. M.P.Seah and W.A. Dench ![]() ![]() You can also use the help of a database to calculate a matrix density. |